I am using the Keil uVision5 IDE with the ULINKpro Debug and Trace
Adaptor connected to the MCB1700 Evaluation Board. (Target MCU is the
NXP LPC1768)
It has been discovered that when in a debug session, analog to
digital conversions are affected with additional noise.
This has been revealed by duplicating the ADC result to the DAC
and scoping the output.
Does anyone have a solution/suggestion(s) in regards to the
additional noise on ADC samples caused by JTAG/Trace during a
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